Monografie:
- S. Hałgas: "Metody symulacji i diagnostyki analogowych układów elektronicznych", Zeszyty Naukowe Nr 1042, Wydawnictwo Politechniki Łódzkiej, Łódź 2009.
- M. Tadeusiewicz, S. Hałgas: "Komputerowe metody analizy układów analogowych: Teoria i zastosowania", WNT 2008.
- M. Tadeusiewicz, S. Hałgas, J. Ziemnicki: "Laboratorium teorii obwodów", Łódź 2007.
- J.
Bek, E. Chojnacka, S. Hałgas, M. Korzybski, S. Kozłowska, A. Kuczyński,
H. Morawska: "Laboratorium z Podstaw Elektrotechniki", Łódź
2002.
- M. Tadeusiewicz, A. Kuczyński, S. Hałgas, 'Catastrophic fault diagnosis of a certain class of nonlinear analog circuits', Circuits, Systems, and Signal Processing, vol. 34, No. 2, 353-375, 2015.
- M. Tadeusiewicz, S. Hałgas, A. Kuczyński, 'SNew aspects of fault diagnosis of nonlinear analog circuits', International Journal of Electronics and Telecommunications, Vol.61, No.1, 83-93, 2015.
- M. Tadeusiewicz, S. Hałgas, 'New approach to multiple soft fault diagnosis of analog BJT and CMOS circuits', IEEE Transactions on Instrumentation and Measurement, Vol.64, No.10, 2688-2695, 2015.
- M. Tadeusiewicz, A. Kuczyński, S. Hałgas, 'Spot defect diagnosis in analog nonlinear circuits with possible multiple operating points', Journal of Electronic Testing: Theory and Applications (J Electron Test), vol. 31, No. 4, 491-502, 2015.
- M. Tadeusiewicz, S. Hałgas, 'Diagnosis of spot short defects in analog circuits considering the thermal behavior of the chip', Metrology and Measurement Systems, vol. 23, No.2, 239-250, 2016.
- M. Tadeusiewicz, S. Hałgas, 'Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology', Analog Integrated Circuits and Signal Processing, vol. 88, No. 1, 65-77, 2016.
- M. Tadeusiewicz, S. Hałgas, 'A systematic method for arranging diagnostic tests in linear analog DC and AC circuits', Journal of Electronic Testing: Theory and Applications , vol. 33, 147-156, 2017.
- M. Tadeusiewicz, S. Hałgas, 'Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits', Microelectronics Reliability , vol. 72, 90-97, 2017.
- M. Tadeusiewicz, S. Hałgas, 'A method for local parametric fault diagnosis of a broad class of analog integrated circuits', IEEE Transactions on Instrumentation and Measurement, Vol. 67, No. 2, 328-337, 2018.
- M. Tadeusiewicz, S. Hałgas, 'A fault verification method for testing of analogue electronic circuits', Metrology and Measurement Systems, vol. 25, No.2, 331-346, 2018.
- M. Tadeusiewicz, S. Hałgas, 'A method for multiple soft fault diagnosis of linear analog circuits', Measurement, vol. 131, 714-722, 2019.
- M. Tadeusiewicz, S. Hałgas, 'A method for fault diagnosis of nonlinear circuits', COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, vol. 38, 1770-1781, 2019.
- M. Tadeusiewicz, S. Hałgas, 'Soft fault diagnosis of linear circuits with the special attention paid to the circuits containing current conveyors', AEU - International Journal of Electronics and Communications, vol. 115, 153036, 2020.
- M. Tadeusiewicz, S. Hałgas, 'Soft fault diagnosis of non-linear circuits having multiple DC solutions', IET Circuits, Devices & Systems, vol. 14 No.8, 1220-1227, 2020.
- M. Tadeusiewicz, S. Hałgas, 'A method for diagnosing soft short and open faults in distributed parameter multiconductor transmission lines', Electronics , 10(1), 35; 2021
- M. Tadeusiewicz, S. Hałgas, 'Parametric fault diagnosis of very high-frequency circuits containing distributed parameter transmission lines', Electronics , 10(5), 505; 2021
- M. Tadeusiewicz, S. Hałgas, 'A Method for Parametric and Catastrophic Fault Diagnosis of Analog Linear Circuits', IEEE Access, Vol. 10, pp. 27002-27013, 2022.