Stanisław Hałgas received the M.Sc. degree in electronic engineering from the Lodz University of Technology Poland in 1991, the Ph.D. degree in technical sciences in 1998, and D.Sc. degree (Habilitation) in electronics from Lodz University of Technology in 2010.
Currently, he is currently Head of the Nonlinear Circuits and Systems Division, Lodz University of Technology.
He has author or co-author one monograph, one textbook, and more then 100 technical papers.
His current research activities concentrate on the areas of nonlinear circuits' analysis and fault diagnosis of analog circuits.


Selected publications (2015--):

  • M. Tadeusiewicz, S. Hałgas, 'New approach to multiple soft fault diagnosis of analog BJT and CMOS circuits', IEEE Transactions on Instrumentation and Measurement, Vol.64, No.10, 2688-2695, 2015.
  • M. Tadeusiewicz, A. Kuczyński, S. Hałgas, 'Spot defect diagnosis in analog nonlinear circuits with possible multiple operating points', Journal of Electronic Testing: Theory and Applications (J Electron Test), vol. 31, No. 4, 491-502, 2015.
  • M. Tadeusiewicz, S. Hałgas, 'Diagnosis of spot short defects in analog circuits considering the thermal behavior of the chip', Metrology and Measurement Systems, vol. 23, No.2, 239-250, 2016.
  • M. Tadeusiewicz, S. Hałgas, 'Multiple soft fault diagnosis of DC analog CMOS circuits designed in nanometer technology', Analog Integrated Circuits and Signal Processing, vol. 88, No. 1, 65-77, 2016.
  • M. Tadeusiewicz, S. Hałgas, 'A systematic method for arranging diagnostic tests in linear analog DC and AC circuits', Journal of Electronic Testing: Theory and Applications , vol. 33, 147-156, 2017.
  • M. Tadeusiewicz, S. Hałgas, 'Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits', Microelectronics Reliability , vol. 72, 90-97, 2017.
  • M. Tadeusiewicz, S. Hałgas, 'A method for local parametric fault diagnosis of a broad class of analog integrated circuits', IEEE Transactions on Instrumentation and Measurement, Vol. 67, No. 2, 328-337, 2018.
  • M. Tadeusiewicz, S. Hałgas, 'A fault verification method for testing of analogue electronic circuits', Metrology and Measurement Systems, vol. 25, No.2, 331-346, 2018.
  • M. Tadeusiewicz, S. Hałgas, 'A method for multiple soft fault diagnosis of linear analog circuits', Measurement, vol. 131, 714-722, 2019.
  • M. Tadeusiewicz, S. Hałgas, 'A method for fault diagnosis of nonlinear circuits', COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, vol. 38, 1770-1781, 2019.
  • M. Tadeusiewicz, S. Hałgas, 'Soft fault diagnosis of linear circuits with the special attention paid to the circuits containing current conveyors', AEU - International Journal of Electronics and Communications, vol. 115, 153036, 2020.
  • M. Tadeusiewicz, S. Hałgas, 'Soft fault diagnosis of non-linear circuits having multiple DC solutions', IET Circuits, Devices & Systems, vol. 14 No.8, 1220-1227, 2020.
  • M. Tadeusiewicz, S. Hałgas, 'A method for diagnosing soft short and open faults in distributed parameter multiconductor transmission lines', Electronics , 10(1), 35; 2021
  • M. Tadeusiewicz, S. Hałgas, 'Parametric fault diagnosis of very high-frequency circuits containing distributed parameter transmission lines', Electronics , 10(5), 505; 2021
  • M. Tadeusiewicz, S. Hałgas, 'A Method for Parametric and Catastrophic Fault Diagnosis of Analog Linear Circuits', IEEE Access, Vol. 10, pp. 27002-27013, 2022.


   
Complete list of publications